Camera-Ready Instructions and Paper Templates

Paper submissions should be limited to a maximum of 12 pages in the IEEE 2-column format (see Conference Templates).
They should be limited to a maximum of 12 pages and be submitted in PDF format.

Please use the IEEE eXpress PDF tool (Conference ID : rcis09x)to convert your source file into IEEE Xplore compliant PDF File or to check if your own PDF file is IEEE Xplore compliant. IEEE PDF eXpress is a free service to IEEE conferences, allowing their authors to make IEEE Xplore-compatible PDFs (Conversion function) or to check PDFs that authors have made themselves for IEEE Xplore compatibility (PDF Check function).
It is important to note that submitting a file to IEEE PDF eXpress is only for creation of a compliant PDF file, you must still submit your final paper through online submission.

How to use IEEE PDF eXpress (Conference ID : rcis09x)

You may download the Word or Latex templates form RCIS'09 Site by using the links below. All papers must be submitted in PDF format for reviewing. Communications must be written in english.

Authors are kindly requested to produce and provide the full paper, without any reference to the authors. The manuscript must contain, in its first page, the paper title, the paper category (technical solution, evaluation, industrial, doctoral), an abstract and a list of keywords but no names or contact details are to be included in any part of the file. Authors names will appear only in the final paper version requested after paper acceptation.

Word Template :

Download the author's templates for Microsoft Word. These files contain a template for you to use in creating your paper (without authors names).

LaTeX Template :

• For PC and Mac, use: IEEEtran.zip LaTeX2e Transactions style file and IEEEtranBST.zip bibliography style file.
• For Unix, use: IEEEtran.tar.gz LaTeX2e Transactions style file and IEEEtranBST.tar.gz bibliography style file.
  

Download the PDF version of IEEE "Information for Authors" kit

Download PDF Specification for IEEE Xplore

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